Kikuchi Diffraction during which electrons leave the electron-transparent sample at the side opposite to the Incident Beam.

Compared to EBSD, TKD has a higher spatial resolution.

In TKD a dedicated "on-axis detector" can be used to record the diffraction pattern at highest intensities and best signal-to-noise ratio.

Sometimes TKD might be referred to as "Transmission EBSD" (t-EBSD). The authors of this glossary consider this however technically wrong and deprecate the use of this terminology.