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The part of the beam which interacts with the sample.
Often electron probe is used to describe a point where the beam is focused. It is commonly used in connection with focused beams.
Beam
https://purls.helmholtz-metadaten.de/emg/EMG_00000024
Reetu Elza Joseph
Pedro Videgain Barranco
Robert Wendt
Christoph Pauly
Oonagh Mannix
Markus Kühbach
Peter Konijnenberg
Annika Strupp
Volker Hofmann
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